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JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working The physical condition of the

SKU: 67897705776

4.8
USD437.00 USD472.00

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Ships within 48 hours · Estimated delivery Jul 26 - Jul 31

Description

The physical condition of the unit is good and clean

This UNIT Instruments UFC-8161 is used working surplus

Part No: E17W-H52

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This UNIT Instruments 1100-100039 is used working surplus

JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working The physical condition of theJEOL Secondary Electron Detector JWS 2000 Wafer Defect Review SEM Working Part No: Secondary Electron Detector Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 3 lbs. Only items

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