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Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL BP101734-02 PCB Card is used working surplus
The unit has a cracked front panel and will not power on (see photos)
Inventory # G7835
TEL Tokyo Electron Part No: 3D80-000053-V1
These Devicenet 10150603 16’6” cables are used working surplus
Nikon 249 Motorized Optical Inspection Objective Assembly NRM-3100 Working Removed from a JEOL JWS-2000Nikon 249 Motorized Optical Inspection Objective Assembly NRM 3100 Working Part No: 249 Removed from a Nikon NRM 3100 300mm Wafer Overlay Measurement System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 15 lbs. Shipping Terms: All Domestic and International shipping